Radioelektronikos terminų žodynas. – Vilnius : BĮ UAB „Litimo“. Kazimieras Gaivenis, Gytis Juška, Vidas Kalesinskas. 2000.
distribution des défauts par densité — defektų tankio pasiskirstymas statusas T sritis radioelektronika atitikmenys: angl. defect density distribution vok. Defektdichteverteilung, f rus. распределение плотности дефектов, n pranc. distribution des défauts par densité, f … Radioelektronikos terminų žodynas
Defektdichteverteilung — defektų tankio pasiskirstymas statusas T sritis radioelektronika atitikmenys: angl. defect density distribution vok. Defektdichteverteilung, f rus. распределение плотности дефектов, n pranc. distribution des défauts par densité, f … Radioelektronikos terminų žodynas
defektų tankio pasiskirstymas — statusas T sritis radioelektronika atitikmenys: angl. defect density distribution vok. Defektdichteverteilung, f rus. распределение плотности дефектов, n pranc. distribution des défauts par densité, f … Radioelektronikos terminų žodynas
распределение плотности дефектов — defektų tankio pasiskirstymas statusas T sritis radioelektronika atitikmenys: angl. defect density distribution vok. Defektdichteverteilung, f rus. распределение плотности дефектов, n pranc. distribution des défauts par densité, f … Radioelektronikos terminų žodynas
распределение дефектов по плотности — — [http://slovarionline.ru/anglo russkiy slovar neftegazovoy promyishlennosti/] Тематики нефтегазовая промышленность EN defect density distribution … Справочник технического переводчика
Carrier scattering — Defect types include atom vacancies, adatoms, steps, and kinks which occur most frequently at surfaces due to finite material size causing crystal discontinuity. What all types of defects have in common, whether they be surface or bulk, is that… … Wikipedia
Checking whether a coin is fair — In statistics, the question of checking whether a coin is fair is one whose importance lies, firstly, in providing a simple problem on which to illustrate basic ideas of statistical inference and, secondly, in providing a simple problem that can… … Wikipedia
Deep-level transient spectroscopy — (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are … Wikipedia
Three-dimensional integrated circuit — In electronics, a three dimensional integrated circuit (3D IC, 3D IC, or 3 D IC) is a chip in which two or more layers of active electronic components are integrated both vertically and horizontally into a single circuit. The semiconductor… … Wikipedia
Donald Eigler — Don Eigler and Neon in front of one of the two Scanning Tunneling Microscopes at Almaden Donald M. Eigler is a physicist and IBM Fellow at the IBM Almaden Research Center. On September 28, 1989 he achieved a landmark in humankind’s ability to… … Wikipedia
